Title :
Maximizing the finesse in a high finesse interferometer
Author :
Brasseur, J.K. ; Repasky, K.S. ; Carlsten
Author_Institution :
Physics Department, Montana State University
Keywords :
Coatings; Electronic mail; Length measurement; Mirrors; Optical microscopy; Physics; Plasmons; Reflectivity; Size measurement; Surface fitting;
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4125-2
DOI :
10.1109/CLEO.1997.602373
