Title :
Biomedical application of high-resolution infrared and parallel processing technologies
Author :
Coffield, Patrick C. ; Gooden, Clarence E.
Author_Institution :
Wright Lab., Elgin AFB, FL, USA
fDate :
31 Oct-3 Nov 1996
Abstract :
The Armament Directorate is developing a high-resolution infrared focal plane array and massively parallel image processor for smart weapons technology. This paper addresses the emergent applicability of these technologies to biomedical digital imagery in general. The authors specifically address this infrared data acquisition and processing combination for its potential application in the areas of intervention surgery, pathology, thermography, and anesthesiology. Researchers in major university medical centers and several national laboratories are experimenting with diagnostic methods involving digital infrared systems. In many cases, these advanced methods are computationally intensive. Without the aid of advanced, real-time, computing technology such methods are not suitable for real-time operative procedures. A hardware and software combination capable of evaluating all of these promising methodologies is needed
Keywords :
biomedical equipment; data acquisition; focal planes; image resolution; medical image processing; parallel processing; semiconductor quantum wells; Armament Directorate; advanced real-time computing technology; anesthesiology; biomedical digital imagery; hardware & software combination; high-resolution infrared focal plane array; infrared data acquisition; intervention surgery; major university medical centers; massively parallel image processor; national laboratories; pathology; real-time operative procedures; smart weapons technology; thermography; Biomedical imaging; Computers; Data acquisition; Digital images; Hardware; Infrared imaging; Medical diagnostic imaging; Pathology; Surgery; Weapons;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.646444