Fast fab scheduling rule selection by ordinal comparison-based simulation

Author

Hsieh, Bo-Wei ; Chen, Chun-Hung ; Chang, Shi-Chung

Author_Institution

Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan

fYear

1999

fDate

1999

Firstpage

53

Lastpage

56

Abstract

In this paper, an ordinal comparison (OC)-based simulation tool is designed and applied to achieve fast selection of wafer release and lot dispatching rule combination for fab operations. By comparing relative orders of performance among scheduling rules to a specified level of confidence, the OC approach reduces simulation time significantly. The tool consists of (1) a discrete event simulator, (2) a fab model database, (3) a library of scheduling rules, (4) a library of performance indices, (5) an ordinal comparator, and (6) a computation budget allocation. Rule selections from a set of prominent fab scheduling rules under frequently considered fab performance indices such as mean and variance of cycle time and smoothness are studied over various time horizons by using a benchmark fab model. Results demonstrate a potential improvement in efficiency over traditional simulation by two orders of magnitude. In addition to insights about static selection of rules over various objectives and time horizons, our simulation studies also indicate the necessity of dynamic selection

Keywords

discrete event simulation; dispatching; electronic engineering computing; integrated circuit manufacture; production control; production engineering computing; benchmark fab model; computation budget allocation; cycle time; discrete event simulator; dynamic selection; fab model database; fast fab scheduling rule selection; lot dispatching rule combination; ordinal comparison-based simulation; performance indices library; scheduling rules library; semiconductor manufacturing; simulation time reduction; simulation tool; wafer release; Computational modeling; Fabrication; Industrial engineering; Investments; Job shop scheduling; Libraries; Probability; Processor scheduling; Production; Systems engineering and theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on

Conference_Location

Santa Clara, CA

ISSN

1523-553X

Print_ISBN

0-7803-5403-6

Type

conf

DOI

10.1109/ISSM.1999.808736

Filename

808736