Title :
Implementation of modeling and simulation in semiconductor wafer fabrication with time constraints between wet etch and furnace operations
Author :
Scholl, Wolfgang ; Domaschke, Joerg
Author_Institution :
Infineon Technols., Dresden, Germany
Abstract :
In semiconductor wafer fabrication time constraints between process steps in furnace and wet etch causes a lot of problems for shop floor control to achieve cycle time targets and maximize machine utilization. Infineon Technologies Dresden has conducted a study, using discrete event simulation, to investigate the actual situation in the factory and to identify recommendations, to eliminate or to reduce the impact of time constraints. This paper presents a 2-day reduction in total cycle time, after implementation of findings in the factory
Keywords :
discrete event simulation; etching; semiconductor process modelling; Infineon Technologies Dresden; cycle time; discrete event simulation; factory shop floor control; furnace operation; machine utilization; process modeling; semiconductor wafer fabrication; time constraint; wet etching; Chemistry; Contamination; Discrete event simulation; Fabrication; Furnaces; Oxidation; Production facilities; Semiconductor device modeling; Time factors; Wet etching;
Conference_Titel :
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-5403-6
DOI :
10.1109/ISSM.1999.808738