DocumentCode
3366767
Title
Implementation of modeling and simulation in semiconductor wafer fabrication with time constraints between wet etch and furnace operations
Author
Scholl, Wolfgang ; Domaschke, Joerg
Author_Institution
Infineon Technols., Dresden, Germany
fYear
1999
fDate
1999
Firstpage
61
Lastpage
63
Abstract
In semiconductor wafer fabrication time constraints between process steps in furnace and wet etch causes a lot of problems for shop floor control to achieve cycle time targets and maximize machine utilization. Infineon Technologies Dresden has conducted a study, using discrete event simulation, to investigate the actual situation in the factory and to identify recommendations, to eliminate or to reduce the impact of time constraints. This paper presents a 2-day reduction in total cycle time, after implementation of findings in the factory
Keywords
discrete event simulation; etching; semiconductor process modelling; Infineon Technologies Dresden; cycle time; discrete event simulation; factory shop floor control; furnace operation; machine utilization; process modeling; semiconductor wafer fabrication; time constraint; wet etching; Chemistry; Contamination; Discrete event simulation; Fabrication; Furnaces; Oxidation; Production facilities; Semiconductor device modeling; Time factors; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
0-7803-5403-6
Type
conf
DOI
10.1109/ISSM.1999.808738
Filename
808738
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