• DocumentCode
    3366767
  • Title

    Implementation of modeling and simulation in semiconductor wafer fabrication with time constraints between wet etch and furnace operations

  • Author

    Scholl, Wolfgang ; Domaschke, Joerg

  • Author_Institution
    Infineon Technols., Dresden, Germany
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    61
  • Lastpage
    63
  • Abstract
    In semiconductor wafer fabrication time constraints between process steps in furnace and wet etch causes a lot of problems for shop floor control to achieve cycle time targets and maximize machine utilization. Infineon Technologies Dresden has conducted a study, using discrete event simulation, to investigate the actual situation in the factory and to identify recommendations, to eliminate or to reduce the impact of time constraints. This paper presents a 2-day reduction in total cycle time, after implementation of findings in the factory
  • Keywords
    discrete event simulation; etching; semiconductor process modelling; Infineon Technologies Dresden; cycle time; discrete event simulation; factory shop floor control; furnace operation; machine utilization; process modeling; semiconductor wafer fabrication; time constraint; wet etching; Chemistry; Contamination; Discrete event simulation; Fabrication; Furnaces; Oxidation; Production facilities; Semiconductor device modeling; Time factors; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-5403-6
  • Type

    conf

  • DOI
    10.1109/ISSM.1999.808738
  • Filename
    808738