Abstract :
The following topics are dealt with: electronic circuit; system design; mixed-signal design; mixed-signal testing; IP design; analog design; analog testing; fault diagnosis; physical design; power aware design; fault tolerance; reliability; hardware-software codesign; nanotechnology problem; 3D design; memory design; logic design; and reconfigurable system.
Keywords :
analogue circuits; fault diagnosis; fault tolerance; hardware-software codesign; integrated memory circuits; logic design; nanoelectronics; network synthesis; 3D design; IP design; analog design; analog testing; electronic circuit; fault diagnosis; fault tolerance; hardware-software codesign; logic design; memory design; mixed-signal design; mixed-signal testing; nanotechnology problem; physical design; power aware design; reconfigurable system; system design;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
DOI :
10.1109/DDECS.2011.5783024
