DocumentCode :
3366884
Title :
Manufacturing tolerances impact on millimeter wave enhanced gain patch antenna performance
Author :
Rojansky, V. ; Winebrand, M.
Author_Institution :
Dept. of Radar & Electro-Opt., Israel Aircraft Ind. Ltd., Yehud, Israel
Volume :
3
fYear :
1998
fDate :
21-26 June 1998
Firstpage :
1348
Abstract :
Rojansky and Winebrand (1997) validated the feasibility of a Ka-band rectangular patch antenna gain enhancement method, based on substrate-superstrate resonance. Substantial consonance between theoretical and sample antenna measurement results was observed. A thorough study of the manufacturing tolerances impact on the antenna performance is presented in this paper. The following factors affecting the gain of the antenna operating in the upper Ka frequency band are covered: (a) substrate-superstrate distance deviation from the nominal one; (b) superstrate tilt relative to substrate and (c) superstrate surface roughness. Allowable ranges of the manufacturing tolerances considering the above parameters are established. These tolerances are well inside the limits of the modern manufacturing capabilities. Therefore, the enhanced gain patch antenna operating at millimeter waves (Ka frequency band) can be easily manufactured and happens to be a comprehensive and cost effective solution for various applications.
Keywords :
microstrip antennas; millimetre wave antennas; Ka-band; antenna measurement; manufacturing tolerances; millimeter wave enhanced gain patch antenna performance; rectangular patch antenna gain enhancement; substrate-superstrate distance deviation; substrate-superstrate resonance; superstrate surface roughness; superstrate tilt; Antenna measurements; Antenna theory; Frequency; Millimeter wave measurements; Millimeter wave technology; Patch antennas; Pulp manufacturing; Resonance; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
Type :
conf
DOI :
10.1109/APS.1998.690747
Filename :
690747
Link To Document :
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