DocumentCode :
3366990
Title :
Future of EDA: Usual suspect or silent hero for successful semiconductor business?
Author :
Alt, Jürgen
Author_Institution :
Intel Mobile Commun. GmbH, Neubiberg, Germany
fYear :
2011
fDate :
13-15 April 2011
Firstpage :
3
Lastpage :
3
Abstract :
Summary form only given. During history of semiconductor development Computer-Aided Design developed into Electronic Design Automation. Point tools provided by CAD/EDA industry were selected by industrial design flows and integrated to make use of best-in class tools available for product development. This was a useful approach to target the classical focus segments for semiconductor design: area, verification and technology enabling. During the last years additional design parameters like power optimization have been introduced successfully into industrial design flows. There is still a need to improve tools addressing these technical design constraints within the foreseeable future. Main focus of future design flows have to be on additional business constraints like overall manufacturing cost and Time-to-Volume. The world of semiconductor business has changed significantly during the last years. Product development is globally distributed. Value chain from specification to development to manufacturing is split-up over various countries and continents. Supply chain to customers requires more flexibility. Market window for most of the products is getting smaller and smaller. Design-for-Test may serve as an example for linking design and manufacturing disciplines within semiconductor development. This discipline covers design teams and test engineering. To control Time-to-Volume and Cost-of-Yield of a product, production engineering teams need effective diagnosis environment linking data bases from design, test engineering and manufacturing sites. This example shows the required borderless approach to be addressed by future EDA tools.
Keywords :
design for testability; electronic design automation; product development; semiconductor industry; supply chain management; CAD/EDA industry; business constraints; classical focus segments; cost-of-yield of a product; design parameters; design teams; design-for-test; diagnosis environment; electronic design automation; industrial design flows; manufacturing sites; market window; overall manufacturing cost; power optimization; product development; production engineering; semiconductor business; semiconductor design; semiconductor development computer-aided design; supply chain; technical design constraints; test engineering; time-to-volume; value chain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
Type :
conf
DOI :
10.1109/DDECS.2011.5783033
Filename :
5783033
Link To Document :
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