DocumentCode
3367008
Title
SiGe BiCMOS platform - baseline technology for More Than Moore process module integration
Author
Tillack, Bernd
Author_Institution
IHP, Frankfurt (Oder), Germany
fYear
2011
fDate
13-15 April 2011
Firstpage
4
Lastpage
4
Abstract
Summary form only given. Future silicon based integrated circuits technology is targeting on reduced transistor dimensions, increased transistor counts and increased operating frequencies. By reaching the nanometer scale region lateral and vertical structures have to be processed which are close to atomic dimensions (ITRS “More Moore” approach). Moreover, emerging research devices and technologies are under investigation to extend the CMOS technology further on or to evaluate solutions for beyond Si CMOS technologies like introducing Ge or III-V material channel replacement. According to the ITRS the alternative “More Than Moore” approach is targeting on diversification by combining different technologies based on a reasonable scaling level. The paper gives an overview of the “More than Moore” strategy based on examples of IHP´s SiGe BiCMOS technology. SiGe BiCMOS technologies combine high speed SiGe HBTs, computing power of CMOS, and high-quality passives on a single chip. RF performance of HBTs has been improved a lot over the years enabling mm-wave applications like automotive radar (77 GHz), high data rate fiber links (>;100 Gb/s), and Gb/s wireless links (60 GHz, 122 GHz,). Research activities are targeting HBTs allowing THz frequencies (EU FP 7 project DOTFIVE). In a “More than Moore” approach the functionality of the BiCMOS technology is extended by integrating optical components (Si Photonics) and MEMS structures. Moreover, the monolithic or hybrid hetero-integration of Si and III/V compound semiconductor technologies are under investigation enabling new System-on-Chip-solutions.
Keywords
BiCMOS integrated circuits; Ge-Si alloys; III-V semiconductors; heterojunction bipolar transistors; micromechanical devices; system-on-chip; Gb/s wireless link; III-V compound semiconductor technology; III-V material channel replacement; MEMS structure; SiGe; SiGe BiCMOS platform; SiGe HBT; automotive radar; high data rate fiber links; hybrid hetero-integration; monolithic hetero-integration; more than Moore approach; optical component; reduced transistor dimension; silicon based integrated circuits technology; silicon photonics; system-on-chip solution; vertical structure;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location
Cottbus
Print_ISBN
978-1-4244-9755-3
Type
conf
DOI
10.1109/DDECS.2011.5783034
Filename
5783034
Link To Document