DocumentCode
3367144
Title
Testing the performance of delta-sigma ADCs
Author
El-Koubysi, A.R. ; Guo, Y. ; Lucas, M.S.P.
Author_Institution
Kansas State Univ., Manhattan, KS, USA
fYear
1992
fDate
12-14 May 1992
Firstpage
514
Lastpage
517
Abstract
Available test techniques and their suitability for testing delta-sigma analog-to-digital converters (ADCs) are reviewed. Two commonly-used dynamic tests, sine-wave curve fitting and discrete finite Fourier transform analysis, are discussed in some detail. It is noted that conventional ADC performance measures such as peak error and integral and differential nonlinearity are not readily applicable to delta-sigma ADCs that employ feedback and oversampling. The sinusoidal minimum-error test method for delta-sigma ADCs, described by B.E. Boser (1988), which is based on spectral estimation techniques, is reviewed. With this method, the error at the output of a converter is determined by minimizing the power of the difference between the output signal and a template comprising a sinusoid at the frequency of the input signal, a DC offset, and explicitly evaluated harmonics. The method is compared with sine wave fitting
Keywords
analogue-digital conversion; curve fitting; electronic equipment testing; fast Fourier transforms; harmonic analysis; ADC; ADC performance; DC offset; delta-sigma analog-to-digital converters; discrete finite Fourier transform analysis; dynamic tests; feedback; harmonics; nonlinearity; oversampling; sine-wave curve fitting; sinusoidal minimum-error test; spectral estimation; template; Delta modulation; Feedback loop; Filters; Frequency conversion; Low-frequency noise; Noise shaping; Quantization; Sampling methods; Signal to noise ratio; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location
Metropolitan, NY
Print_ISBN
0-7803-0640-6
Type
conf
DOI
10.1109/IMTC.1992.245084
Filename
245084
Link To Document