DocumentCode :
3367338
Title :
Optimal number and placement of Through Silicon Vias in 3D Network-on-Chip
Author :
Xu, Thomas Canhao ; Liljeberg, Pasi ; Tenhunen, Hannu
Author_Institution :
Dept. of Inf. Technol., Univ. of Turku, Turku, Finland
fYear :
2011
fDate :
13-15 April 2011
Firstpage :
105
Lastpage :
110
Abstract :
In this paper, we analyze the performance impact of different number of Through Silicon Vias (TSVs) in 3D Network-on-Chip (NoC). The adoption of a 3D NoC design depends on the performance and manufacturing cost of the chip. Therefore, a study of the placement of the TSV, that connects different layers of a 3D chip, is crucial. A 64-core 3D NoC is modeled based on state-of-the-art 2D chips. We discuss the number of TSVs required for a 3D NoC. Different placements of layer-layer connections are explored. We present benchmark results using a cycle accurate full system simulator based on realistic workloads. Experiments show that under different workloads, the average network latencies in two configurations (full and quarter connection) are reduced by 14.78% and 7.38% respectively, compared with the one-eighth connection design. The improvement of performance is a trade-off of manufacturing cost. Our analysis and experiment results provide a guideline for selecting optimal number of TSVs in 3D NoCs.
Keywords :
network-on-chip; three-dimensional integrated circuits; 3D network-on-chip; optimal number; through silicon vias; Manufacturing; Routing; Silicon; Stacking; System-on-a-chip; Three dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
Type :
conf
DOI :
10.1109/DDECS.2011.5783057
Filename :
5783057
Link To Document :
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