• DocumentCode
    336734
  • Title

    On the characteristics and effects of loudness during utterance production in continuous speech recognition

  • Author

    Tapias, D. ; Cazassus, C.

  • Author_Institution
    Telefonica Investigacion y Desarrollo, Madrid
  • Volume
    1
  • fYear
    1999
  • fDate
    15-19 Mar 1999
  • Firstpage
    89
  • Abstract
    We have checked out that, in speech recognition based telephone applications, the loudness with which the speech signal is produced is a source of degradation of the word accuracy if it is lower or higher than normal. For this reason, we have carried out a research work which has reached three goals: (a) get a better understanding of the speech production loudness (SPL) phenomenon, (b) find out the parameters of the speech recognizer that are the most affected by loudness variations, and (c) compute the effects of SPL and whispery speech in large vocabulary continuous speech recognition (LVCSR). In this paper we report the results of this study for three different loudnesses (low, normal and high) and whispery speech. We also report the word accuracy degradation of a continuous speech recognition system when the speech production loudness is different than normal as well as the degradation for whispery speech. The study has been done using the TRESVOL Spanish database, that was designed to study, evaluate and compensate the effect of loudness and whispery speech in LVCSR systems
  • Keywords
    loudness; speech recognition; LVCSR; TRESVOL Spanish database; continuous speech recognition; degradation; large vocabulary continuous speech recognition; speech production loudness; speech recognition based telephone applications; utterance production; whispery speech; word accuracy; Continuous production; Databases; Degradation; Humans; Loudspeakers; Signal to noise ratio; Speech analysis; Speech recognition; Stress; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1999. Proceedings., 1999 IEEE International Conference on
  • Conference_Location
    Phoenix, AZ
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-5041-3
  • Type

    conf

  • DOI
    10.1109/ICASSP.1999.758069
  • Filename
    758069