Characterization of ferromagnetic materials for microelectronics applications over a wide range of frequencies

Author

Riahi-Kashani, M.M. ; Elshabini-Riad, A.

Author_Institution

Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA

fYear

1992

fDate

12-14 May 1992

Firstpage

430

Lastpage

435

Abstract

Two methods for the accurate evaluation of magnetic constant of ferrite pastes, ferrite epoxies, and ferrite substrates are proposed. The first method, used for the low- to mid-frequency range (DC-100 MHz), is based on current image. The permeability is calculated by measuring the inductance of thick film spiral inductors printed on the magnetic material under test. A frequency-domain coaxial cavity method is used for the mid- to high-frequency range (50 MHz-2 GHz). The complex magnetic constant (complex permeability), and the complex dielectric constant (complex permittivity) are calculated using data obtained by this method

Keywords

ferrites; ferromagnetic properties of substances; inductance measurement; magnetic permeability measurement; 0 to 100 MHz; 50 MHz to 2 GHz; MnZnFe₂O₄; NiZnFe₂O₄; complex permeability; complex permittivity; current image; ferrite epoxies; ferrite pastes; ferrite substrates; ferromagnetic materials; frequency-domain coaxial cavity; inductance; magnetic constant; microelectronics applications; permeability; thick film spiral inductors; Dielectric measurements; Ferrites; Inductance measurement; Magnetic materials; Microelectronics; Permeability measurement; Permittivity measurement; Substrates; Thick films; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE

Conference_Location

Metropolitan, NY

Print_ISBN

0-7803-0640-6

Type

conf

DOI

10.1109/IMTC.1992.245102

Filename

245102