Title :
Characterization of ferromagnetic materials for microelectronics applications over a wide range of frequencies
Author :
Riahi-Kashani, M.M. ; Elshabini-Riad, A.
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
Two methods for the accurate evaluation of magnetic constant of ferrite pastes, ferrite epoxies, and ferrite substrates are proposed. The first method, used for the low- to mid-frequency range (DC-100 MHz), is based on current image. The permeability is calculated by measuring the inductance of thick film spiral inductors printed on the magnetic material under test. A frequency-domain coaxial cavity method is used for the mid- to high-frequency range (50 MHz-2 GHz). The complex magnetic constant (complex permeability), and the complex dielectric constant (complex permittivity) are calculated using data obtained by this method
Keywords :
ferrites; ferromagnetic properties of substances; inductance measurement; magnetic permeability measurement; 0 to 100 MHz; 50 MHz to 2 GHz; MnZnFe2O4; NiZnFe2O4; complex permeability; complex permittivity; current image; ferrite epoxies; ferrite pastes; ferrite substrates; ferromagnetic materials; frequency-domain coaxial cavity; inductance; magnetic constant; microelectronics applications; permeability; thick film spiral inductors; Dielectric measurements; Ferrites; Inductance measurement; Magnetic materials; Microelectronics; Permeability measurement; Permittivity measurement; Substrates; Thick films; Thickness measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
DOI :
10.1109/IMTC.1992.245102
