Title :
A unique team model for yield improvement across the fab/sort manufacturing (F/SM) to assembly/test manufacturing (A/TM) divide
Author :
McGovern, Eamonn J. ; Wallace, Bob ; Tapp, Kristin A.
Author_Institution :
Ireland Fab Oper., Intel Corp., Leixlip, Ireland
Abstract :
Assembly output is a constraint to Intel´s bottom line and manufacturing ramp capability. Fab and Sort contribute to yield loss and throughput time loss within assembly. The Fab-Sort-Assembly-Integration (FSAI) Jumbo Joint Engineering Team (JJET) was established in 1996 to address fab-to-assembly process issues. This forum has since evolved into a global team composed of essential process experts-a unique technical interface between fab/sort manufacturing (F/SM) and assembly/test manufacturing (A/TM). This paper presents the operational and structural model of the FSAI JJET. It also describes the FSAI JJET´s role in the resolution of technical issues and facilitation of yield improvements across all 0.xy μm logic technologies. Significant accomplishments are briefly presented
Keywords :
integrated circuit yield; microassembling; production testing; project engineering; FSAI JJET; FSAI Jumbo Joint Engineering Team; IC production; Intel; assembly output constraint; assembly/test manufacturing; fab-to-assembly process issues; fab/sort manufacturing; global team; manufacturing ramp capability; operational and structural model; structural model; submicron logic technologies; team model; throughput time loss; yield improvement; yield loss; Assembly; Bonding; History; Packaging; Petroleum; Samarium; Testing; Tiles; Virtual manufacturing; Wire;
Conference_Titel :
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-5403-6
DOI :
10.1109/ISSM.1999.808795
