DocumentCode :
3367777
Title :
Continuous and independent monitor wafer reduction in DRAM fab
Author :
Watanabe, Akira ; Kobayashi, Takuya ; Egi, Toshio ; Yoshida, Tomonobu
Author_Institution :
KMT Semicond. Ltd., Hyogo, Japan
fYear :
1999
fDate :
1999
Firstpage :
303
Lastpage :
306
Abstract :
DRAM short product life cycle and intense cost reduction battle in the market require monitor wafer effective reduction in manufacturing. Actions for monitor wafer reduction are as follows: we increased the ratio of the usage of vendor reclaimed wafers. For more reduction, we organized two teams to monitor wafer reduction in the manufacturing group and to extend monitor wafer in-house recycling and standardized simple way of measurement reduction. As a result of these activities, the ratio of monitor wafer to wafer start decreased from 1.5 (1993) to 0.5 (1999)
Keywords :
DRAM chips; integrated circuit manufacture; process monitoring; standardisation; DRAM fab; cost reduction; manufacturing; measurement reduction standardized; monitor wafer reduction; product life cycle; vendor reclaimed wafers; Costs; Delay; History; Manufacturing processes; Mass production; Monitoring; Productivity; Random access memory; Recycling; Turning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1523-553X
Print_ISBN :
0-7803-5403-6
Type :
conf
DOI :
10.1109/ISSM.1999.808796
Filename :
808796
Link To Document :
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