DocumentCode
3367801
Title
A variation-aware adaptive voltage scaling technique based on in-situ delay monitoring
Author
Wirnshofer, Martin ; Heiss, Leonhard ; Georgakos, Georg ; Schmitt-Landsiedel, Doris
Author_Institution
Inst. for Tech. Electron., Tech. Univ. Munchen, Munich, Germany
fYear
2011
fDate
13-15 April 2011
Firstpage
261
Lastpage
266
Abstract
In this paper, we present an adaptive voltage scaling (AVS) scheme to tune the supply voltage of digital circuits according to variations. Compared to worst-case designs, which produce fixed and excessively large safety margins, a considerable amount of energy can be saved by this approach. The AVS technique is based on in-situ delay monitoring, i.e. observing the timing in critical paths. For this task, we propose a Pre-Error flip-flop, that is capable of detecting late data transitions - so-called pre-errors. We provide an in-depth analysis, that is based on a Markov model, to describe the closed loop voltage regulation. We simulated the power saving potential compared to the worst-case design and obtained a reduction of 13.5% in active energy for a negligible error rate of 1E-15. Moreover, we illustrate the opportunity to further reduce the power consumption when tolerating higher error rates. This way, our approach can gain the optimal power saving for a given allowed failure probability.
Keywords
Markov processes; closed loop systems; computerised monitoring; digital circuits; error statistics; flip-flops; power aware computing; power consumption; probability; voltage control; AVS scheme; AVS technique; Markov model; active energy; closed loop voltage regulation; digital circuits; failure probability; in-depth analysis; in-situ delay monitoring; late data transitions; negligible error rate; power consumption; power saving potential; pre-error flip-flop; safety margins; supply voltage; variation-aware adaptive voltage scaling technique; worst-case designs; Clocks; Delay; Monitoring; Temperature measurement; Temperature sensors; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location
Cottbus
Print_ISBN
978-1-4244-9755-3
Type
conf
DOI
10.1109/DDECS.2011.5783090
Filename
5783090
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