DocumentCode :
3368155
Title :
Thick epitaxial YIG films with narrow FMR linewidth
Author :
Syvorotka, Ihor I. ; Syvorotka, Ihor M. ; Ubizskii, S.B.
Author_Institution :
SRC “Carat”, R&D Institute of Materials, Lviv, Ukraine
fYear :
2012
fDate :
3-7 Sept. 2012
Firstpage :
264
Lastpage :
265
Abstract :
The La-doped yttrium iron garnet (YIG) films with thickness up to 130 µm were grown by liquid phase epitaxy (LPE) method. All grown thick films demonstrate “mirror” and “striation” types of surface morphology that depend from film growth temperature and thickness. Addition of B2O3 is favourable to a change the surface morphology into a “mirror” one. The mechanisms of the morphological changes are discussed. It was found that the ferromagnetic resonance (FMR) linewidth appreciably depends from surface morphology of grown films. For thick films with “mirror” surface the FMR linewidth is less than 0.8 Oe and more than ten times less in comparison with films with “striation” surface.
Keywords :
Epitaxial growth; Garnets; Magnetic resonance; Mirrors; Morphology; Surface morphology; ferromagnetic resonance linewidth; liquid phase epitaxy; surface morphology; yttrium iron garnet films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
Conference_Location :
Lviv, Ukraine
Print_ISBN :
978-1-4673-4491-3
Type :
conf
DOI :
10.1109/OMEE.2012.6464774
Filename :
6464774
Link To Document :
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