DocumentCode
3368155
Title
Thick epitaxial YIG films with narrow FMR linewidth
Author
Syvorotka, Ihor I. ; Syvorotka, Ihor M. ; Ubizskii, S.B.
Author_Institution
SRC “Carat”, R&D Institute of Materials, Lviv, Ukraine
fYear
2012
fDate
3-7 Sept. 2012
Firstpage
264
Lastpage
265
Abstract
The La-doped yttrium iron garnet (YIG) films with thickness up to 130 µm were grown by liquid phase epitaxy (LPE) method. All grown thick films demonstrate “mirror” and “striation” types of surface morphology that depend from film growth temperature and thickness. Addition of B2 O3 is favourable to a change the surface morphology into a “mirror” one. The mechanisms of the morphological changes are discussed. It was found that the ferromagnetic resonance (FMR) linewidth appreciably depends from surface morphology of grown films. For thick films with “mirror” surface the FMR linewidth is less than 0.8 Oe and more than ten times less in comparison with films with “striation” surface.
Keywords
Epitaxial growth; Garnets; Magnetic resonance; Mirrors; Morphology; Surface morphology; ferromagnetic resonance linewidth; liquid phase epitaxy; surface morphology; yttrium iron garnet films;
fLanguage
English
Publisher
ieee
Conference_Titel
Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
Conference_Location
Lviv, Ukraine
Print_ISBN
978-1-4673-4491-3
Type
conf
DOI
10.1109/OMEE.2012.6464774
Filename
6464774
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