• DocumentCode
    3368155
  • Title

    Thick epitaxial YIG films with narrow FMR linewidth

  • Author

    Syvorotka, Ihor I. ; Syvorotka, Ihor M. ; Ubizskii, S.B.

  • Author_Institution
    SRC “Carat”, R&D Institute of Materials, Lviv, Ukraine
  • fYear
    2012
  • fDate
    3-7 Sept. 2012
  • Firstpage
    264
  • Lastpage
    265
  • Abstract
    The La-doped yttrium iron garnet (YIG) films with thickness up to 130 µm were grown by liquid phase epitaxy (LPE) method. All grown thick films demonstrate “mirror” and “striation” types of surface morphology that depend from film growth temperature and thickness. Addition of B2O3 is favourable to a change the surface morphology into a “mirror” one. The mechanisms of the morphological changes are discussed. It was found that the ferromagnetic resonance (FMR) linewidth appreciably depends from surface morphology of grown films. For thick films with “mirror” surface the FMR linewidth is less than 0.8 Oe and more than ten times less in comparison with films with “striation” surface.
  • Keywords
    Epitaxial growth; Garnets; Magnetic resonance; Mirrors; Morphology; Surface morphology; ferromagnetic resonance linewidth; liquid phase epitaxy; surface morphology; yttrium iron garnet films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
  • Conference_Location
    Lviv, Ukraine
  • Print_ISBN
    978-1-4673-4491-3
  • Type

    conf

  • DOI
    10.1109/OMEE.2012.6464774
  • Filename
    6464774