• DocumentCode
    3368341
  • Title

    Narrowband multifrequency binary measurement using phase shift keyed modulation

  • Author

    Henderson, I.A. ; McGhee, J. ; Al-Muhaisni, M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Strathclyde Univ., Glasgow, UK
  • fYear
    1992
  • fDate
    12-14 May 1992
  • Firstpage
    180
  • Lastpage
    185
  • Abstract
    Multifrequency binary testing (MBT) employs binary test signals to evaluate frequency response estimates. Multifrequency binary sequence (MBS) test signals allow the capture of a wide variety of frequency information with excellent signal-to-noise-power ratios for their dominant harmonics. Two identification channel coding theorems use compact binary codes and digital modulation as the basis of signal engineering techniques to design MBS test signals. Information theory is used to design a novel MBS in symbol form which will allow simple microcomputer generation of these signals. Phase-shift-keyed (PSK) MBS signals are designed with a zoom attribute to identify narrowband frequency information with a high spectral resolution. The frequency zoom attribute is similar to the optical zoom of a camera and is designed to detail a narrower and narrower portion of a frequency response record
  • Keywords
    automatic test equipment; binary sequences; encoding; harmonic analysis; microcomputer applications; phase shift keying; signal generators; signal processing; binary codes; binary test signals; carrier redundancy; descriptive languages; digital modulation; frequency response; frequency response estimates; frequency zoom; harmonics; identification channel coding; microcomputer generation; multifrequency binary measurement; narrowband frequency information; phase shift keyed modulation; signal-to-noise-power ratios; Binary codes; Binary sequences; Channel coding; Frequency estimation; Frequency response; Narrowband; Phase measurement; Signal design; Signal processing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
  • Conference_Location
    Metropolitan, NY
  • Print_ISBN
    0-7803-0640-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1992.245154
  • Filename
    245154