Title :
PROGEN: a program generator to generate conversion programs for test patterns
Author :
Schmitz, C. ; Lackmann, R. ; Rennett, T.
Author_Institution :
Fraunhofer Inst. for Microelectron. Circuits & Syst., Duisburg, Germany
Abstract :
Due to the constantly increasing number of circuit simulators and test systems it is necessary to develop new programs which convert the format of the test patterns from that of the simulator into that of the tester. The program generator PROGEN automatically generates preprocessors which convert the different simulator data formats into CADDIF (computer aided design data interchange format). CADDIF is a simulator- and tester-independent data format. With this general data structure, the test patterns can be adapted to any test system with the help of suitable programs. An EFD language has been developed to describe the simulator data formats. Using the format defined by the EFD language, PROGEN generates the corresponding preprocessor. PROGEN provides automatic generation, and requires only short preconditioning time when the format of a simulator changes due to a new version
Keywords :
application generators; automatic programming; automatic test equipment; circuit analysis computing; digital simulation; electronic data interchange; EFD language; PROGEN; automatic generation; circuit simulators; computer aided design data interchange format; data structure; preprocessors; program generator; test patterns; Automatic programming; Automatic testing; Circuit simulation; Circuit testing; Computational modeling; Data structures; Digital circuits; System testing; Test pattern generators; Timing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1992. IMTC '92., 9th IEEE
Conference_Location :
Metropolitan, NY
Print_ISBN :
0-7803-0640-6
DOI :
10.1109/IMTC.1992.245157
