Title :
TLM protocol compliance checking at the Electronic System Level
Author :
Bawadekji, Mohamed ; Grosse, Daniel ; Drechsler, Rolf
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
Abstract :
Design and verification of embedded systems at the Electronic System Level (ESL) is common practice. In particular, Transaction Level Modeling (TLM) is the major reason for the success of ESL design. However, when detailed protocols are modeled at lower levels of TLM, the verification of the communication becomes a critical issue. In this paper, we present an approach for protocol compliance checking of new or detailed protocol implementations. They are checked against user-specified protocol sequences. We also analyze the protocol coverage achieved by the testbench and visualize the results on a protocol sequence graph. Experimental results for a SoC model demonstrate the advantages of our method.
Keywords :
electronic design automation; formal verification; integrated circuit design; integrated circuit modelling; protocols; system-on-chip; ESL design; SoC model; TLM protocol compliance checking; detailed protocol implementations; electronic system level; embedded systems; protocol coverage; protocol sequence graph; protocols; testbench; transaction level modeling; user-specified protocol sequences; verification; Analytical models; Computational modeling; Protocols; Radiation detectors; System-on-a-chip; Time domain analysis; Time varying systems;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
Conference_Location :
Cottbus
Print_ISBN :
978-1-4244-9755-3
DOI :
10.1109/DDECS.2011.5783132