• DocumentCode
    3368518
  • Title

    TTTC: Test Technology Technical Council

  • fYear
    2011
  • fDate
    13-15 April 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Provides a listing of current committee members.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011 IEEE 14th International Symposium on
  • Conference_Location
    Cottbus
  • Print_ISBN
    978-1-4244-9755-3
  • Type

    conf

  • DOI
    10.1109/DDECS.2011.5783138
  • Filename
    5783138
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3368518