Title :
Low threshold operation of MOCVD grown 1.3 μm range GaInNAs triple quantum-well lasers with low N content GaNAs barrier layers
Author :
Kaminishi, M. ; Sato, S. ; Takahashi, T. ; Satoh, S.
Author_Institution :
Res. & Dev. Center, Ricoh Co. Ltd., Miyagi, Japan
fDate :
31 May-4 June 2004
Abstract :
GaInNAs TQW lasers with different barrier materials grown by MOCVD were fabricated to evaluate their characteristics. It was confirmed that the Jth of the lasers with N containing barriers was lower than that of lasers with no N containing barriers. The lowest Jth have been realized with GaAsN (N:0.27 and 0.8%) barriers in GaInNAs lasers. The very low Jth of 120 A/cm2/well for 1.27 μm laser grown with optimized growth condition have been realized with low N containing GaNAs barriers.
Keywords :
III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; indium compounds; nitrogen compounds; optical fabrication; optimisation; quantum well lasers; semiconductor growth; 1.27 mum; 1.3 mum; GaInNAs-GaAsN; MOCVD; barrier layers; low threshold operation; stripe laser; threshold current density; triple quantum-well lasers; Capacitive sensors; Chemical lasers; Crystalline materials; Crystallization; Gallium arsenide; Inorganic materials; MOCVD; Optical materials; Quantum well lasers; X-ray lasers;
Conference_Titel :
Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
Print_ISBN :
0-7803-8595-0
DOI :
10.1109/ICIPRM.2004.1442609