DocumentCode :
3368878
Title :
Point defects and diffusion in oxides
Author :
Shi, Jack ; Becker, K.-D.
Author_Institution :
Insitite of Physical and Theoretical Chemistry, Technische Universität Braunschweig, Germany
fYear :
2012
fDate :
3-7 Sept. 2012
Firstpage :
151
Lastpage :
152
Abstract :
Electronic and ionic defects are unavoidable elements of structural disorder in oxide materials resulting from nonstoichiometry or impurity/doping ions. Many point defects involving electrons or transition metal ions give rise to optical absorption, providing a probe to study defect chemistry and transport properties in these materials. We present the application of optical in-situ spectroscopy to the investigation of defects and defect-related processes at elevated temperatures in N-doped titania films and Li-deficient lithium niobate.
Keywords :
Absorption; Kinetic theory; Lithium niobate; Niobium; Optical films; Optical sensors; Oxidation; N-doped TiO2-δ thin film; diffusion; lithium niobate; optical spectroscopy; point defects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
Conference_Location :
Lviv, Ukraine
Print_ISBN :
978-1-4673-4491-3
Type :
conf
DOI :
10.1109/OMEE.2012.6464810
Filename :
6464810
Link To Document :
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