DocumentCode :
3368971
Title :
IGBT behavior during desat detection and short circuit fault protection
Author :
Bhalla, A. ; Shekhawat, S. ; Gladish, J. ; Yedinak, J. ; Dolny, G.
Author_Institution :
Harris Semicond., Mountain Top, PA, USA
fYear :
1998
fDate :
3-6 Jun 1998
Firstpage :
245
Lastpage :
248
Abstract :
A common fault condition in motor drive applications involves an IGBT turning on into a short-circuit. If the only impedance is the cable inductance to a shorted motor winding, the current through the device ramps up very rapidly until it saturates, forcing the IGBT voltage to rise to the DC clamp. After fault detection, depending on the point at which the fast turn-off pulse is applied, very different levels of hole current can flow under the n+ source region, making this an important factor in the successful containment of the fault current. We present experimental observations showing that IGBT failure under short-circuit conditions is dependent on where the turn-off pulse is applied. The physics of this behavior is explained using numerical mixed-mode simulations. A practical two step gate waveform is studied for avoidance of device failure under short-circuit conditions, and is experimentally demonstrated
Keywords :
failure analysis; fault location; insulated gate bipolar transistors; motor drives; numerical analysis; power bipolar transistors; semiconductor device models; semiconductor device reliability; semiconductor device testing; short-circuit currents; DC clamp; IGBT; IGBT current saturation; IGBT failure; IGBT turn-on; IGBT voltage; cable inductance; desat detection; device failure; fast turn-off pulse; fault condition; fault current; fault detection; hole current; impedance; motor drive applications; n+ source region; numerical mixed-mode simulations; short circuit fault protection; short-circuit; short-circuit conditions; shorted motor winding; turn-off pulse; two step gate waveform; Circuit faults; DC motors; Electrical fault detection; Fault detection; Impedance; Inductance; Induction motors; Insulated gate bipolar transistors; Motor drives; Turning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
Conference_Location :
Kyoto
ISSN :
1063-6854
Print_ISBN :
0-7803-4752-8
Type :
conf
DOI :
10.1109/ISPSD.1998.702679
Filename :
702679
Link To Document :
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