Title :
Reliability Assessment of a 1 MV LTD
Author :
Leckbee, J. ; Maenchen, J. ; Portillo, S. ; Cordova, S. ; Molina, I. ; Johnson, D.L. ; Kim, A.A. ; Chavez, R. ; Ziska, D.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM
Abstract :
A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.
Keywords :
diodes; pulse generators; reliability; timing jitter; transformers; accelerator; cavity timing jitter; electron-beam diode load; linear transformer driver; output pulse; radiography; reliability; voltage 1 MV; voltage 6 MV; Capacitors; Circuit testing; Diodes; Electronic equipment testing; Insulator testing; Laboratories; Pulse transformers; Space vector pulse width modulation; Switches; Voltage;
Conference_Titel :
Pulsed Power Conference, 2005 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-9189-6
Electronic_ISBN :
0-7803-9190-x
DOI :
10.1109/PPC.2005.300524
