DocumentCode :
3369099
Title :
Testing object-oriented programs - an integrated approach
Author :
Chen, Mei-Hwa ; Kao, Howard M.
Author_Institution :
State Univ. of New York, Albany, NY, USA
fYear :
1999
fDate :
1999
Firstpage :
73
Lastpage :
82
Abstract :
Traditional testing techniques often overlook object-oriented faults that are either caused by inheritance and/or polymorphism features or are introduced in object management. We present an object-flow based testing strategy that utilizes two object-flow coverage criteria (all-bindings and all-du-pairs) in testing object-oriented programs. The all-bindings criterion takes inheritance and polymorphism features into account to ensure that every binding of every object is exercised under some test. The all-du-pairs criterion is applied to monitor the behavior of every object during its lifetime by keeping track of where the object is defined (d) and where such a definition is referenced or used (u). These object-flow coverage criteria can be used to develop test cases that are able to trigger object-oriented faults. Furthermore, an integrated approach that incorporates the object-flow based testing strategy with traditional testing techniques as well as state-based testing technique is introduced. The results of our empirical study conducted on three industrial systems show that, with this approach, the reliability of the systems can be improved significantly and at least 80% of the maintenance cost can be reduced
Keywords :
inheritance; object-oriented programming; program testing; software maintenance; software reliability; all-bindings criterion; all-du-pairs criterion; industrial systems; inheritance; integrated approach; object behaviour monitoring; object definition-use pairs; object management; object-flow based testing strategy; object-flow coverage criteria; object-oriented fault triggering; object-oriented program testing; polymorphism; software maintenance cost reduction; state-based testing technique; system reliability; Automation; Costs; Electrical capacitance tomography; Encapsulation; Fault detection; Independent component analysis; Life testing; Microwave integrated circuits; Monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering, 1999. Proceedings. 10th International Symposium on
Conference_Location :
Boca Raton, FL
ISSN :
1071-9458
Print_ISBN :
0-7695-0443-4
Type :
conf
DOI :
10.1109/ISSRE.1999.809312
Filename :
809312
Link To Document :
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