Title :
Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design
Author :
Yen, Cheng-Cheng ; Lin, Wan-Yen ; Ker, Ming-Dou ; Tsai, Ching-Ling ; Chen, Shih-Fan ; Chen, Tung-Yang
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
New on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.
Keywords :
data conversion; elemental semiconductors; silicon; transients; Si; digital output codes; electrical fast transient disturbance; on-chip transient-to-digital converter; silicon chip; system protection design; word length 4 bit; CMOS integrated circuits; Earth Observing System; Electrostatic discharge; Microelectronics; System-on-a-chip; Transient analysis; Voltage measurement; electrical fast transient (EFT) test; electromagnetic compatibility (EMC); transient detection circuit; transient-to-digital converter;
Conference_Titel :
IC Design & Technology (ICICDT), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4244-9019-6
DOI :
10.1109/ICICDT.2011.5783183
