Title :
The use of variable load for RF circuit testing
Author :
Kyziol, Piotr ; Grzechca, Damian ; Golonek, Tomasz ; Rutkowski, Jerzy
Author_Institution :
Inst. of Electron., Silesian Univ. of Technol., Gliwice
Abstract :
The testing and diagnosis catastrophic faults technique for analog high frequency (HF) circuits (passive filters and impedance matching circuits) is described in this paper. The novel method based on load and frequency as testing pair has been proposed. The impact of load on testing and diagnostic has been investigated. The best pairs of load and frequency have been chosen. The proposed approach of testing analog HF circuits allows to increase diagnostic CUT with catastrophic faults and tolerance dispersion. The testing method has been checked for impedance matching circuit from RFID HF reader.
Keywords :
circuit testing; impedance matching; radiofrequency integrated circuits; RF circuit testing; analog high frequency circuits; catastrophic faults; impedance matching circuits; passive filters; tolerance dispersion; variable load; Circuit faults; Circuit testing; Electronic equipment testing; Electronic mail; Fault diagnosis; Hafnium; Impedance matching; Power measurement; Radio frequency; System testing; Impedance matching; RF testing; RFID;
Conference_Titel :
Signals and Electronic Systems, 2008. ICSES '08. International Conference on
Conference_Location :
Krakow
Print_ISBN :
978-83-88309-47-2
Electronic_ISBN :
978-83-88309-52-6
DOI :
10.1109/ICSES.2008.4673496
