• DocumentCode
    3369673
  • Title

    TSV number minimization using alternative paths

  • Author

    Cheng, Chun-Hua ; Kuo, Chih-Hsien ; Huang, Shih-Hsu

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2011
  • fDate
    2-4 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In a three-dimensional integrated circuit (3D IC) design, through-silicon-vias (TSVs) are used for data transfer across layers. However, TSVs act as obstacles during the stage of placement and routing and have a negative impact on chip yield. Therefore, TSV number minimization is an important topic for 3D IC design. In this paper, we point out that there often exist idle functional units and idle TSVs at each control step. If we use idle functional units and idle TSVs to form an alternative path to replace direct TSVs for data transfer, the number of TSVs can be reduced. Based on that observation, we present an ILP (integer linear programming) approach to formally draw up our problem. Given a high-level synthesis result and a clock period constraint, we perform post-processing to fully utilize alternative paths for TSV number minimization. Compared with previous work that minimizes the TSV number without considering alternative paths, experimental results show that our approach can further reduce 16.92% TSV number without affecting the circuit performances.
  • Keywords
    integer programming; linear programming; minimisation; three-dimensional integrated circuits; TSV number minimization; chip yield; clock period constraint; data transfer; high-level synthesis; integer linear programming; three-dimensional integrated circuit design; Adders; Clocks; Delay; Integrated circuit interconnections; Minimization; Three dimensional displays; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC Design & Technology (ICICDT), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-9019-6
  • Type

    conf

  • DOI
    10.1109/ICICDT.2011.5783203
  • Filename
    5783203