Title :
Electron-transporting layer effects on blue phosphorescent organic light-emitting diodes
Author :
Tzu-Chan Lin ; Tien-Lung Chiu
Author_Institution :
Dept. of Photonics Eng., Yuan Ze Univ., Chungli, Taiwan
Abstract :
In this work, we demonstrated the electron-transporting layer (ETL) effects on device electroluminescence (EL) performance of blue phosphorescent organic light-emitting diodes (PhOLED). Three well known electron-transporting materials such as 3-(4-biphenyl-yl)-4-phenyl-5-(4-tert-butylphenyl)-1,2,4-triazole (TAZ), diphenyl-bis[4-(pyridin-3-yl)phenyl]silane (DPPS) and 1,3,5-tri( m-pyrid-3-yl-phenyl)benzene (TmPyPB) were employed as ETL inside a blue PhOLED. The material properties of these three ETL materials individually dominated the different location of carrier recombination and exciton formation inside device, especially carrier mobility. By investigating the EL performance of these three devices, one can be concluded that high carrier mobility ETL results to a low driving voltage, worse carrier confinement in the emitting layer, greater amount of leakage electrons. The great efficiency performance is dominated by the great carrier confinement in the emitting layer.
Keywords :
carrier mobility; electroluminescence; electron-hole recombination; excitons; organic light emitting diodes; organic semiconductors; phosphorescence; 1,3,5-tri( m-pyrid-3-yl-phenyl)benzene; 3-(4-biphenyl-yl)-4-phenyl-5-(4-tert-butylphenyl)-1,2,4-triazole; blue PhOLED; blue phosphorescent organic light-emitting diodes; carrier confinement; carrier mobility; carrier recombination; device electroluminescence performance; diphenyl-bis[4-(pyridin-3-yl)phenyl]silane; driving voltage; electron-transporting layer effects; electron-transporting materials; emitting layer; exciton formation; leakage electrons; Carrier confinement; Excitons; Indium tin oxide; Organic light emitting diodes; Performance evaluation; Radiative recombination;
Conference_Titel :
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2015 22nd International Workshop on
Conference_Location :
Kyoto
DOI :
10.1109/AM-FPD.2015.7173202