• DocumentCode
    3370243
  • Title

    Design of on-chip Transient Voltage Suppressor in a silicon-based transceiver IC to meet IEC system-level ESD specification

  • Author

    Jiang, Ryan Hsin-Chin ; Tseng, Tang-Kuei ; Chen, Chi-Hao ; Chuang, Che-Hao

  • Author_Institution
    Amazing Microelectron. Corp., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    2-4 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The on-chip Transient Voltage Suppressor (TVS) embedded in the silicon based transceiver IC has been proposed in this paper by using 0.8 μm Bipolar-CMOS-DMOS (BCD) process. The structure of the on-chip TVS is a high voltage Dual Silicon-Controlled-Rectifier (DSCR) with ±19V of high holding voltage (Vh) under the evaluation of 100 ns pulse width of the Transmission Line Pulsing (TLP) system. The holding current (Ih) of the on-chip TVS is so high that can pass ±200 mA latchup testing. Therefore, the on-chip TVS can be safely applied to protect the ±12 V of signal level for RS232. The RS232 transceiver IC with on-chip TVS has been evaluated to pass the IEC61000-4-2 contact ±12 kV stress without any hard damages and latchup issue. Moreover, the RS232 transceiver IC also has been verified to well protect the system over the IEC61000-4-2 contact ±20 kV stress (CLASS B) in the smart scanner and notebook application.
  • Keywords
    CMOS integrated circuits; IEC standards; bipolar integrated circuits; electrostatic discharge; elemental semiconductors; integrated circuit design; silicon; thyristors; IEC system-level ESD specification; IEC61000-4-2 contact; RS232 transceiver IC; Si; bipolar-CMOS-DMOS process; dual silicon-controlled-rectifier; latchup testing; notebook; on-chip transient voltage suppressor; silicon-based transceiver IC; size 0.8 mum; smart scanner; transmission line pulsing system; Discharges; Electrostatic discharge; Layout; Stress; System-on-a-chip; Transceivers; ESD; RS232; SCR; TVS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC Design & Technology (ICICDT), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-9019-6
  • Type

    conf

  • DOI
    10.1109/ICICDT.2011.5783236
  • Filename
    5783236