DocumentCode :
3370243
Title :
Design of on-chip Transient Voltage Suppressor in a silicon-based transceiver IC to meet IEC system-level ESD specification
Author :
Jiang, Ryan Hsin-Chin ; Tseng, Tang-Kuei ; Chen, Chi-Hao ; Chuang, Che-Hao
Author_Institution :
Amazing Microelectron. Corp., Hsinchu, Taiwan
fYear :
2011
fDate :
2-4 May 2011
Firstpage :
1
Lastpage :
4
Abstract :
The on-chip Transient Voltage Suppressor (TVS) embedded in the silicon based transceiver IC has been proposed in this paper by using 0.8 μm Bipolar-CMOS-DMOS (BCD) process. The structure of the on-chip TVS is a high voltage Dual Silicon-Controlled-Rectifier (DSCR) with ±19V of high holding voltage (Vh) under the evaluation of 100 ns pulse width of the Transmission Line Pulsing (TLP) system. The holding current (Ih) of the on-chip TVS is so high that can pass ±200 mA latchup testing. Therefore, the on-chip TVS can be safely applied to protect the ±12 V of signal level for RS232. The RS232 transceiver IC with on-chip TVS has been evaluated to pass the IEC61000-4-2 contact ±12 kV stress without any hard damages and latchup issue. Moreover, the RS232 transceiver IC also has been verified to well protect the system over the IEC61000-4-2 contact ±20 kV stress (CLASS B) in the smart scanner and notebook application.
Keywords :
CMOS integrated circuits; IEC standards; bipolar integrated circuits; electrostatic discharge; elemental semiconductors; integrated circuit design; silicon; thyristors; IEC system-level ESD specification; IEC61000-4-2 contact; RS232 transceiver IC; Si; bipolar-CMOS-DMOS process; dual silicon-controlled-rectifier; latchup testing; notebook; on-chip transient voltage suppressor; silicon-based transceiver IC; size 0.8 mum; smart scanner; transmission line pulsing system; Discharges; Electrostatic discharge; Layout; Stress; System-on-a-chip; Transceivers; ESD; RS232; SCR; TVS;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IC Design & Technology (ICICDT), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
ISSN :
Pending
Print_ISBN :
978-1-4244-9019-6
Type :
conf
DOI :
10.1109/ICICDT.2011.5783236
Filename :
5783236
Link To Document :
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