Title :
Section 5: Defects, impurities and transport phenomena in oxide crystal
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
Oxide Materials for Electronic Engineering (OMEE), 2012 IEEE International Conference on
Conference_Location :
Lviv, Ukraine
Print_ISBN :
978-1-4673-4491-3
DOI :
10.1109/OMEE.2012.6464889
