Title :
Mechanisms for Explosively-Formed Fuse Performance Degradation
Author :
Tasked, D.G. ; Goforth, James H. ; Fowler, Clarence M. ; Herrera, Dennis H. ; Torres, David T. ; King, James C. ; Oona, Henn ; Kiuttu, Gerald F. ; Degnan, James H. ; Domonkos, Matthew T. ; Lehr, F. Mark ; Ruden, Edward L. ; Tucker, Wesley D. ; Cavazos, Th
Author_Institution :
Los Alamos Nat. Lab., Los Alamos, NM
Abstract :
The Explosively-Formed Fuse (EFF) is a high-power opening switch that uses an explosive charge to interrupt current flow in an aluminum conductor [1]. As such we expected the foil´s resistance to increase with increasing current density by Joule heating. Yet an analysis of a large number of experiments clearly showed the opposite was true; there was a strong negative correlation between the peak resistance and current density. In the paper we analyze various possible causes including thermal softening of the metal, magnetic loading of the explosive and electric breakdown or conduction in the product gases at the higher applied fields. Our analysis suggests that magnetic loading is responsible for the degradation.
Keywords :
current density; electric breakdown; electric fuses; switchgear; Joule heating; aluminum conductor; current density; electric breakdown; explosive charge; explosively-formed fuse performance degradation; high-power opening switch; magnetic loading; peak resistance; thermal softening; Aluminum; Conductors; Current density; Degradation; Electric resistance; Explosives; Fuses; Magnetic analysis; Resistance heating; Switches;
Conference_Titel :
Pulsed Power Conference, 2005 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-9189-6
Electronic_ISBN :
0-7803-9190-x
DOI :
10.1109/PPC.2005.300683