DocumentCode
3370482
Title
The life cycle assessment of a telecommunications semiconductor laser
Author
Donaldson, J.D. ; Francis, D.P. ; Snowdon, K.G. ; Spiller, D.O.
Author_Institution
Brunel Univ., Uxbridge, UK
fYear
1995
fDate
9-11 Oct 1995
Firstpage
12
Lastpage
17
Abstract
Life cycle assessments on electronic components is still a relatively new and complex process. Much of the data required for the analysis do not exist. The manufacturing processes involved demand that considerable effort and resources are input to complete a LCA. The LCA of the telecommunications semiconductor laser has shown that it is possible to model part of the product´s life and produce results that are usable
Keywords
environmental factors; life testing; optical communication equipment; semiconductor device models; semiconductor device testing; semiconductor lasers; electronic components; life cycle assessment; manufacturing processes; product life; semiconductor laser model; telecommunications semiconductor laser;
fLanguage
English
Publisher
iet
Conference_Titel
Clean Electronics Products and Technology, 1995. (CONCEPT), International Conference on
Conference_Location
Edinburgh
Print_ISBN
0-85296-651-2
Type
conf
DOI
10.1049/cp:19951151
Filename
491982
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