Title :
The life cycle assessment of a telecommunications semiconductor laser
Author :
Donaldson, J.D. ; Francis, D.P. ; Snowdon, K.G. ; Spiller, D.O.
Author_Institution :
Brunel Univ., Uxbridge, UK
Abstract :
Life cycle assessments on electronic components is still a relatively new and complex process. Much of the data required for the analysis do not exist. The manufacturing processes involved demand that considerable effort and resources are input to complete a LCA. The LCA of the telecommunications semiconductor laser has shown that it is possible to model part of the product´s life and produce results that are usable
Keywords :
environmental factors; life testing; optical communication equipment; semiconductor device models; semiconductor device testing; semiconductor lasers; electronic components; life cycle assessment; manufacturing processes; product life; semiconductor laser model; telecommunications semiconductor laser;
Conference_Titel :
Clean Electronics Products and Technology, 1995. (CONCEPT), International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-651-2
DOI :
10.1049/cp:19951151
