DocumentCode :
3370531
Title :
Design and manufacturing of organic RFID circuits: Coping with intrinsic parameter variations in organic devices by circuit design
Author :
Genoe, Jan ; Myny, Kris ; Steudel, Soeren ; Heremans, Paul
Author_Institution :
Large Area Electron. Dept., Imec, Leuven, Belgium
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
496
Lastpage :
499
Abstract :
A detailed study of device characteristics and parameter variations of organic transistors on foil leads to the conclusion that design of p-type only digital circuits needs to focus on optimal yield, rather than on speed. From this perspective, subsequent generations of organic RFID tags have been realized, by increasing complexity (from 64 bit to 128 bit code generators), by adding functionality (Manchester encoding, anti-collision protocols), and by increasing data rate of the generated ID code (from 752 bits per second towards 50 kbit per second). As such, each of the requirements towards EPC compatible organic RFID tags is shown independently in code generators on foil, but not yet in a single RFID tag.
Keywords :
integrated circuit design; integrated circuit manufacture; protocols; radiofrequency identification; radiofrequency integrated circuits; EPC compatible organic RFID tags; Manchester encoding; anticollision protocols; circuit design; code generators; device characteristics; intrinsic parameter variations; organic RFID circuits; organic devices; organic transistors; p-type only digital circuits; Generators; Modulation; Protocols; RFID tags; Rectifiers; Transistors; Pentacene; design for yield; organic RFID code generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-8193-4
Type :
conf
DOI :
10.1109/ICCAD.2010.5653782
Filename :
5653782
Link To Document :
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