• DocumentCode
    3370698
  • Title

    Impact of the divergence factor on accurate RCS calculation using shooting and bouncing rays

  • Author

    Gao, Wei ; Sui, Miao ; Xu, Xiaojian

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
  • fYear
    2011
  • fDate
    1-3 Nov. 2011
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    The shooting and bouncing rays (SBR) method is a highly powerful technique for radar cross section (RCS) prediction of arbitrarily shaped targets. For the non-flat structures, the divergence factor (DF) plays an important role in accuracate RCS calculation. In practice, triangular surface mesh is widely used in computer aided design (CAD) representation for complex objects. Thus, the DF in SBR is often neglected and taken as unity. In this paper, the curvature matrices of the scattering surfaces are calculated using the surface reconstruction method. In this way, the DF can be conveniently computed by the condition of phase matching. Theoretical analysis and numerical simulations are conducted to show the numeric impact and significance of the DF correction in application of the SBR technique.
  • Keywords
    electromagnetic wave scattering; matrix algebra; mesh generation; radar cross-sections; DF correction; RCS calculation; SBR method; arbitrarily shaped target prediction; complex object CAD representation; computer aided design representation; curvature matrices; divergence factor impact; nonflat structures; numerical simulation; phase matching; radar cross-section; scattering surfaces; shooting and bouncing rays method; surface reconstruction method; triangular surface mesh; Apertures; Optical surface waves; Reflection; Scattering; Surface impedance; Surface reconstruction; Surface waves; divergence factor (DF); radar cross section (RCS); shooting and bouncing rays (SBR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8265-8
  • Type

    conf

  • DOI
    10.1109/MAPE.2011.6156162
  • Filename
    6156162