• DocumentCode
    3370818
  • Title

    On the use of Support Vector Machines for land cover analysis with L-band SAR data

  • Author

    Longépé, Nicolas ; Rakwatin, Preesan ; Isoguchi, Osamu ; Shimada, Masanobu ; Uryu, Yumiko

  • Author_Institution
    Earth Obs. Res. Center, Japan Aerosp. Exploration Agency, Tsukuba, Japan
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    3263
  • Lastpage
    3266
  • Abstract
    This study investigates a new technique for land cover analysis by means of the Support Vector Machines. Intrinsic spatial variability within SAR images, beyond that caused by speckle, is of high interest for land cover characterization and classification. However, its use is still an ongoing issue due to its complex multi-scale nature. On the other hand, classification algorithms based on statistical learning methods such as the supervised Support Vector Machines (SVM) approach are implemented in a wide range of data mining applications. SVM can also be used as a technique for feature selection. In this paper, a new tool using the Recursive Feature Elimination SVM-based process (SVM-RFE) and the textural Haralick´s parameters is introduced. The real contribution of textures within the land cover classification can be understood. A small set of textural parameters is determined at local scale while being optimal for the land cover discrimination. In this study, orthorectified 50m resolution data acquired by the L-band PALSAR/ALOS sensor are used.
  • Keywords
    image classification; remote sensing; support vector machines; synthetic aperture radar; L-band SAR data; intrinsic spatial variability; land cover analysis; recursive feature elimination SVM-based process; statistical learning methods; support vector machines; textural Haralick parameters; Features selection; Forest; Land Cover Classification; Support Vector Machines (SVM); Synthetic Aperture Radar (SAR); Textures Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5653803
  • Filename
    5653803