• DocumentCode
    3370977
  • Title

    A single chip computational sensor system for gamma isotope identification

  • Author

    Schemm, Nathan ; Liang, Bo ; Balkir, Sina ; Hoffman, Michael W. ; Bauer, Mark

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Nebraska-Lincoln, Lincoln, NE, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    2271
  • Lastpage
    2274
  • Abstract
    This paper presents the design and test results of a computational radiation sensor system based on a single chip solution that can perform standalone gamma isotope identification. A low power sensor front end with a charge sensitive amplifier, an event driven analog-to-digital converter, and a dedicated microcontroller are integrated on the same chip to process and bin the isotope data from a NaI gamma ray detector according to gathered pulse height. This combination effectively implements a single chip multichannel analyzer with the capability to do further processing of the data in software. To that end, a compact fixed-point program was developed to further analyze the pulse height spectra gathered from a variety of gamma ray sources and perform on-chip real-time gamma isotope identification. The design was fabricated in a 0.18 μm CMOS technology with field tests demonstrating the validity of the approaches taken. The total computational sensor system power consumption is less than 30 μW, excluding the detector power consumption. The gamma isotope identification program executes in 70 ms.
  • Keywords
    gamma-ray detection; gamma-rays; isotope detection; particle detectors; pulse height analysers; sensors; CMOS technology; Nal gamma ray detector; computational sensor system; fixed-point program; gamma isotope identification; gamma ray sources; multichannel analyzer; power sensor front end; pulse height spectra; single chip solution; Analog-digital conversion; CMOS technology; Energy consumption; Gamma ray detectors; Isotopes; Microcontrollers; Performance evaluation; Pulse amplifiers; Sensor systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5536951
  • Filename
    5536951