DocumentCode :
3371199
Title :
Polarisation insensitive electroabsorption modulator with record power saturation using strained InGaAsP/InGaAsP/InAsP MQW structure
Author :
Ougazzaden, A. ; Devaux, F.
Author_Institution :
France Telcom, CNET, Bagneux, France
fYear :
1996
fDate :
21-25 Apr 1996
Firstpage :
238
Lastpage :
239
Abstract :
Polarisation insensitive multi-quantum wells electroabsorption modulators becomes very attractive for optical communications, in particular for in line applications where the incident light polarisation is random. One key issue of the modulators remains their power saturation. The phenomenon cited as limiting power saturation is the accumulation of holes, in the quantum wells, which creates screening of applied field. To overcome this problem a low height barrier for holes is necessary to decrease the escape time of holes. In the InGaAsP system the relatively large valance band offset prevents a fast holes evacuation. Consequently the quaternary compositions range for wells and barriers which satisfied the two requirements, high power saturation and polarisation insensitivity, is very narrow. In this study we report a innovative design with strain multiquantum well structure InGaAsP/InGaAsP/InAsP giving high power saturation together with polarisation insensitivity. A careful analysis of the structure in terms of band gap engineering has been performed to fulfil the requirements. The growth has been performed by MOCVD at atmospheric pressure. The quality material assessed by photocurrent, DDX, TEM and photoluminescence measurements are presented
Keywords :
III-V semiconductors; electro-optical modulation; electroabsorption; gallium arsenide; gallium compounds; indium compounds; optical communication equipment; optical fabrication; optical saturation; photoemission; photoluminescence; semiconductor heterojunctions; semiconductor quantum wells; transmission electron microscopy; vapour phase epitaxial growth; 1 atm; DDX measurements; InAsP; InGaAsP; InGaAsP-InGaAsP-InAsP; InGaAsP/InGaAsP/InAsP; MOCVD; MQW structure; TEM measurements; atmospheric pressure; band gap engineering; electroabsorption modulator; escape time; in line applications; low height barrier; photocurrent measurements; photoluminescence measurements; polarisation insensitive multi-quantum wells electroabsorption modulators; polarisation insensitivity; power saturation; quantum wells; quaternary compositions range; strain multiquantum well structure; valance band offset; Capacitive sensors; MOCVD; Optical fiber communication; Optical modulation; Optical polarization; Performance analysis; Photoconductivity; Photoluminescence; Photonic band gap; Power engineering and energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
Type :
conf
DOI :
10.1109/ICIPRM.1996.492020
Filename :
492020
Link To Document :
بازگشت