Title :
A novel V-line Radon transform and its imaging applications
Author :
Morvidone, M. ; Truong, T.T. ; Nguyen, M.K. ; Zaidi, H.
Author_Institution :
Lab. de Phys. Theor. et Modelisation, Univ. de Cergy-Pontoise, Cergy-Pontoise, France
Abstract :
Conventional tomographies (e.g. X-ray scanner, Positron Emission Tomography), functioning on primary radiation are modeled by the Radon transform (RT) which is an integral transform defined on straight lines. In this paper, we consider a new RT defined on a pair of half-lines forming a letter V, which arises from modeling two-dimensional emission imaging process by Compton scattered gamma rays. We give its definition and establish its analytic inverse to support the feasibility of the reconstruction of a two-dimensional (2D) image from scattered radiation measured on a one-dimensional collimated camera. Moreover, a filtered back-projection inversion method is also constructed. Its main advantages are algorithmic efficiency and computational rapidity. We present numerical simulations to illustrate the working. To sum up, the V-line RT leads not only to a new imaging principle, but also to a new concept of detector with high energetic resolution capable to collect the scattered radiation.
Keywords :
Radon transforms; biological effects of fields; image reconstruction; medical image processing; Compton scattered gamma rays; V-line Radon transform; algorithmic efficiency; computational rapidity; conventional tomographies; filtered back-projection inversion method; high energetic resolution; image reconstruction; imaging applications; imaging principle; integral transform; numerical simulations; one-dimensional collimated camera; scattered radiation; two-dimensional emission imaging process; two-dimensional image; Cameras; Detectors; Image reconstruction; Photonics; TV; Transforms; Radon transforms; image reconstruction; nuclear imaging; tomography;
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2010.5653835