DocumentCode :
3371747
Title :
2011 International Symposium on VLSI Design, Automation, and Test Organization
fYear :
2011
fDate :
25-28 April 2011
Firstpage :
1
Lastpage :
3
Abstract :
Provides a listing of current committee members and society officers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
Conference_Location :
Hsinchu
ISSN :
Pending
Print_ISBN :
978-1-4244-8500-0
Type :
conf
DOI :
10.1109/VDAT.2011.5783564
Filename :
5783564
Link To Document :
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