Title :
[Copyright notice]
Abstract :
The following topics are dealt with: VLSI design, automation and test; automotive electronics; GPU applications; 3D IC and analog EDA; digital baseband design; SOC platform; radio frequency; MEMS device and circuit; cloud computing; high performance processor design; BIST and DFT; and many-core technologies.
Keywords :
VLSI; automotive electronics; built-in self test; design for testability; electronic design automation; micromechanical devices; microprocessor chips; system-on-chip; three-dimensional integrated circuits; 3D IC; BIST; DFT; GPU application; MEMS circuit; MEMS device; SOC platform; VLSI automation; VLSI design; VLSI test; analog EDA; automotive electronics; digital baseband design; high performance processor design; many-core technologies; radio frequency;
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-8500-0
DOI :
10.1109/VDAT.2011.5783565
