Title :
A nanoparticle-coated nanocrystal-gate for an InP-based heterostructure field-effect transistor
Author :
Do, Q.T. ; Khorenko, V. ; Prost, W. ; Tegude, F.J. ; Katze, K. ; Mertin, W. ; Moore, B. ; Martinez-Albertos, J.-L.
Author_Institution :
Solid-State electronics Dept., Univ. Duisburg-Essen, Duisburg, Germany
fDate :
31 May-4 June 2004
Abstract :
Nanoparticle coated nanocrystals are fabricated by the crystal lattice mediated self-assembly method. While the core material is insulating the conductivity of the nanocrystals is provided by a coating with nanoparticles. Commercially available gold-nanoparticles are selected in order to provide a highly conductive element for a Schottky diode functionality of a junction to a semiconductor. This approach is used to fabricate the gate of an InP-based heterostructure field-effect transistor. The nanoparticle coated nanocrystal gate is deposited and aligned on the device structure by an electrostatic self-assembly via additional side electrodes. The gate voltage is applied to the gate using conductive-tip scanning force microscopy. The output characteristics of the nanoparticle coated nanocrystal gate FET with a gate width and length of 1 μm × 0.36 μm exhibits an extrinsic transconductance of 160 mS/mm.
Keywords :
III-V semiconductors; atomic force microscopy; coatings; electric admittance; gold; indium compounds; junction gate field effect transistors; nanoparticles; self-assembly; 0.36 mum; 1 mum; InP; Schottky diode functionality; conductive-tip scanning force microscopy; conductivity; crystal lattice mediated self-assembly method; electrostatic self-assembly; extrinsic transconductance; gate voltage; gold-nanoparticles; heterostructure field-effect transistor; nanoparticle-coated nanocrystal-gate; Conducting materials; Conductivity; Crystalline materials; HEMTs; Insulation; Lattices; MODFETs; Nanocrystals; Self-assembly; Semiconductor materials;
Conference_Titel :
Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
Print_ISBN :
0-7803-8595-0
DOI :
10.1109/ICIPRM.2004.1442750