Title :
Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs
Author :
Kuper, Fred ; Van der Pol, Jacob ; Ooms, Eric ; Johnson, Tim ; Wijburg, Rutger ; Koster, Willem ; Johnston, Dave
Author_Institution :
Philips Semicond., Nijmegen, Netherlands
fDate :
April 30 1996-May 2 1996
Abstract :
The relation between yield and early failures as encountered in the field was investigated with several high volume IC´s manufactured in several processes. A clear correlation between yield and reliability was found that obeys a simple model. The model also provides the ability to predict the FIT or PPM level of a given IC based on its yield. Using these results we illustrate how a wafer fab may improve the reliability level of its products in a controlled way.
Keywords :
failure analysis; integrated circuit reliability; integrated circuit yield; FIT level; IC manufacture; IC reliability; IC yield; PPM level; continuous early failure rate reduction programs; early failures; high volume ICs; integrated circuits; model; wafer fab reliability level improvement; Application specific integrated circuits; Circuit testing; Failure analysis; Integrated circuit modeling; Integrated circuit reliability; Integrated circuit yield; Jacobian matrices; Life testing; Product design; Semiconductor device modeling;
Conference_Titel :
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-2753-5
DOI :
10.1109/RELPHY.1996.492055
