Title :
An industry-driven laboratory development for mixed-signal IC test education
Author :
Hu, John ; Haffner, Mark ; Yoder, Samantha ; Reehal, Gursharan ; Scott, Mark ; Ismail, Mohammed
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
May 30 2010-June 2 2010
Abstract :
This paper describes a new course on mixed-signal IC test engineering, jointly established by the Department of Electrical and Computer Engineering (ECE) of The Ohio State University and Texas Instruments. The course is motivated by the lack of qualified test engineers in industry and the absence of this education at the collegiate level. The course objective is to help student obtain the fundamental skills required for a mixed-signal IC test engineer. The course structure and laboratory developments are covered in details. Students feedbacks based on anonymous survey indicate that the goals are well met.
Keywords :
electronic engineering education; mixed analogue-digital integrated circuits; industry-driven laboratory development; mixed-signal IC test education; mixed-signal IC test engineering; Analog integrated circuits; Circuit testing; Computer science education; Design engineering; Electrical engineering; Industrial training; Instruments; Integrated circuit testing; Laboratories; Software testing;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537028