Title :
Device Geometry Effects in an Integrated Power Microinductor With a Ni
Fe
Enhancem
Author :
Jamieson, B. ; Godsell, J.F. ; Ningning Wang ; Roy, Sandip
Author_Institution :
Microsyst. Centre, Univ. Coll. Cork, Cork, Ireland
Abstract :
In an integrated power microinductor, the size and shape of the magnetic material will have a relationship to the permeability and inductance of the device. To demonstrate these effects, a set of inductors with closed Ni45Fe55 films were fabricated having similar structures but different footprint sizes and aspect ratios (ARs). Magnetic and electrical characterization was performed on the devices to determine magnetic properties, and in both measurements the same relationship between film shape and magnetic anisotropy is observed. Micromagnetic shape anisotropy simulations were used to predict this behavior and correlate with the experimentally determined parameters. The AR of the film is determined to have a strong influence on the anisotropy and permeability of the magnetic film via shape demagnetization effects which is shown to be a significant variation from the as-deposited magnetic material parameters.
Keywords :
demagnetisation; inductance; iron alloys; magnetic anisotropy; magnetic materials; magnetic permeability; magnetic thin films; micromagnetics; nickel alloys; power inductors; Ni45Fe55; device geometry effect; device inductance; electrical characterization; enhancement layer; film shape; integrated power microinductor; magnetic anisotropy; magnetic characterization; magnetic film; magnetic material; magnetic material parameter; micromagnetic shape anisotropy simulation; permeability; shape demagnetization effect; Anisotropic magnetoresistance; Films; Inductors; Magnetic hysteresis; Permeability; Perpendicular magnetic anisotropy; DC–DC power conversion; magnetic anisotropy; magnetic films; thin-film inductors;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2213826