Title :
A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor
Author :
Wittpahl, V. ; Liu, W. ; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J. ; Yan, K.P.
Author_Institution :
Centre for Integrated Circuit Failure Anal. & Reliability, Nat. Univ. of Singapore, Singapore
fDate :
April 30 1996-May 2 1996
Abstract :
A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between "good" and "bad" devices. A corresponding method using the variation of the junction ideality factor during stressing is also described.
Keywords :
cathodoluminescence; light emitting diodes; semiconductor device reliability; LEDs; degradation monitor; differential cathodoluminescence signal output; junction ideality factor; light output degradation; stressing; Condition monitoring; Degradation; Failure analysis; Light emitting diodes; Optical fiber communication; Optoelectronic devices; Radiative recombination; Scanning electron microscopy; Semiconductor devices; Spontaneous emission;
Conference_Titel :
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-2753-5
DOI :
10.1109/RELPHY.1996.492080
