مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3372459

Title :

Table of contents

fYear :

2008

fDate :

April 27 2008-May 1 2008

Abstract :

Presents the table of contents of the proceedings.

Keywords :

Circuit faults; Committees; Compaction; Delay; IP networks; Jacobian matrices; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 2008. VTS 2008. 26th IEEE

Conference_Location :

San Diego, CA

ISSN :

1093-0167

Print_ISBN :

978-0-7695-3123-6

Type :

conf

DOI :

10.1109/VTS.2008.8

Filename :

4511678

Link To Document :