fDate :
April 27 2008-May 1 2008
Abstract :
Presents the introductory welcome message from the conference proceedings.
Keywords :
CMOS analog integrated circuits; CMOS memory circuits; Circuit testing; Conferences; Educational programs; Fault diagnosis; Radio frequency; Semiconductor device testing; System testing; Technological innovation;
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-0-7695-3123-6
