Title :
Extraction of the average collector velocity in high-speed NpN InP/GaAsSb/InP DHBTs
Author :
Liu, H.G. ; Tao, Nongjian ; Watkins, S.P. ; Bolognesi, C.R.
Author_Institution :
Compound Semicond. Device Lab., Simon Fraser Univ., Burnaby, BC, Canada
fDate :
31 May-4 June 2004
Abstract :
In "type-II" NpN InP/GaAsSb/InP double heterostructure bipolar transistors (DHBTs), the p+ GaAsSb base conduction band edge lies ΔEC above the InP collector conduction band: a small ballistic energy ΔEC is imparted to collected electrons as they are launched into the collector. The high initial velocity should in principle reduce the collector signal delay time. In the present work, we extract the average collector electron velocity in high-speed InP/GaAsSb/InP DHBTs, and find a peak average velocity approaching 4 × 107 cm/s across a 2000 Å InP collector. This finding provides the first evidence of the performance advantage afforded by abrupt type-II B/C junctions for collector transport when compared to the conventional graded \´launchers\´ required when a GaInAs base layer is used.
Keywords :
III-V semiconductors; arsenic compounds; conduction bands; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; 2000 angstrom; DHBT; InP-GaAsSb-InP; collector electron velocity; conduction band edge; double heterostructure bipolar transistors; Data mining; Delay effects; Double heterojunction bipolar transistors; Electrons; Indium phosphide; Laboratories; Physics; Power engineering and energy; Semiconductor devices; Wet etching;
Conference_Titel :
Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
Print_ISBN :
0-7803-8595-0
DOI :
10.1109/ICIPRM.2004.1442781