Optimization of Light Measurements for a Low Energy Plasma

Transient light measurements can be a valuable characteristic to know when measuring a low energy plasma phenomenon. In this particular study, the light to be measured arose from plasma that is being generated on the surface of a metallized polypropylene film strip. The source of this plasma was the metallization being excited by the application of an impulse voltage of up to 2500 V. This impulse voltage yielded the energy required to liberate a small volume of metallization off of the strip of polypropylene film. The polypropylene film had been altered in such a way that the liberation of the metallization occurred in a precise physical location on the film. Even though light successfully emanated from the control location, other discharges occurred on the metallization and contributed to the light intensity measured. This paper will discuss the methods used to measure consistently the transient luminous intensity of a low energy plasma in the infrared spectrum.